Depth Charge: Microscopy of Subsurface Structures (IMAGE)

National Institute of Standards and Technology (NIST)

Depth Charge: Microscopy of Subsurface Structures

Caption

Electric force microscopy can be used to detail structures well below the surface. Left, AFM height image showing the surface of a polyimide/carbon nanotube composite. Right, EFM image revealing the curved lines of subsurface nanotubes.

Credit

NIST

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.