Near Ambient Pressure Photoemission Electron Microscopy (AP-PEEM) Based on Tunable Deep-Ultraviolet (DUV) Laser Source Developed. (IMAGE)

Chinese Academy of Sciences Headquarters

Near Ambient Pressure Photoemission Electron Microscopy (AP-PEEM) Based on Tunable Deep-Ultraviolet (DUV) Laser Source Developed.

Caption

A research group led by Prof. FU Qiang and Prof. BAO Xinhe at the Dalian Institute of Chemical Physics (DICP) of the Chinese Academy of Sciences (CAS) have developed near ambient pressure photoemission electron microscopy (AP-PEEM) with a tunable deep-ultraviolet (DUV) laser source as the excitation source. They designed and constructed a two-stage accelerating electrical field, a three-stage differential pumping system, and a near ambient pressure sample cell.

Credit

Image by LIU Wansheng

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.