Ar Plasma Treated ZnON (IMAGE)
Caption
This is a cross-sectional high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) image and nanobeam diffraction pattern of Ar plasma treated ZnON.
Credit
E. Lee & S. Jeon/Samsung Advanced Institute of Technology & Korea University
Usage Restrictions
This image may be used only with appropriate caption and credit.
License
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