Ear of Corn Infected With Corn Smut (IMAGE)

Donald Danforth Plant Science Center

Ear of Corn Infected With Corn Smut

Caption

Smut fungi are agents of disease responsible for significant crop losses worldwide. Principal Investigator, Dr. Thomas Smith and Research Associate Member, Dr. Dilip Shah at The Donald Danforth Plant Science Center collaborated on a project to develop a variety of corn that is highly resistant to corn smut caused by the fungus, Ustilago maydis.

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Donald Danforth Plant Science Center

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