Nanocrystalline Nickel Under Stress (IMAGE) DOE/Lawrence Berkeley National Laboratory Caption Stress-induced deformation along the edges of nanocrystalline nickel reflect the dislocation activity observed by researchers at Berkeley Lab’s Advanced Light Source using a radial diamond-anvil-cell X-ray diffraction experimental station. Credit Image courtesy of Bin Chen, Berkeley Lab Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.