A Sample Used for the Charge-To-Spin Conversion Experiment (IMAGE)
Caption
This cross-sectional transmission electron microscope image shows a sample used for the charge-to-spin conversion experiment. The nano-sized grains of less than 6 nanometers in the sputtered topological insulator layer created new physical properties for the material that changed the behavior of the electrons in the material.
Credit
Wang Group, University of Minnesota
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With credit.
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