Real-Time Microscopy at High Heat and Loading (IMAGE)

North Carolina State University

Real-Time Microscopy at High Heat and Loading

Caption

This photo offers a look inside the in situ scanning electron microscopy (SEM) heating and loading device. The instrument can capture SEM images at temperatures as high as 1,000 degrees Celsius (C), and at stresses as high as two gigapascal -- which is equivalent to 290,075 pounds per square inch.

Credit

North Carolina State University

Usage Restrictions

Image credit must be given.

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.