NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics (IMAGE)

National Institute of Standards and Technology (NIST)

NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics

Caption

Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.

Credit

M. Strus/NIST

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