Fatigue Effects in Silicon (IMAGE)

National Institute of Standards and Technology (NIST)

Fatigue Effects in Silicon

Caption

Optical micrographs of contact damage in silicon from cyclic stress show progressive damage after (a) 1,000 cycles, (b) 5,000 cycles, (c) 20,000 cycles and (d) 85,000 cycles. Color added for clarity, white circle shows computed size of the contact circle.

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NIST

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