Taking the Stress Out of Magnetic Field Detection (1 of 2) (IMAGE)

National Institute of Standards and Technology (NIST)

Taking the Stress Out of Magnetic Field Detection (1 of 2)

Caption

This transmission electron microscope image shows sections of a continuous 400-nanometer-thick magnetic film of a nickle-iron-copper-molybdenum alloy layered with silver every 100 nanometers. By relieving strain in the film, the silver layers promote the growth of notably larger crystal grains in the layered material as compared to the monolithic film (several are highlighted for emphasis). Electron diffraction patterns (insets) tell a similar story: the material with larger crystal grains display sharper, more discrete scattering patterns.

Credit

Credit: Bonevich, NIST

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