Dislocation Avalanche (IMAGE)

University of Illinois Grainger College of Engineering

Dislocation Avalanche

Caption

This is a dislocation avalanche in a high entropy nanopillar. Focused ion beam is used to fabricated the nanopillar (left) for compression test. Transmission electron microscope is used to image dislocation pile up during a dislocation avalanche (see D on the right).

Credit

Frederick Seitz Materials Research Lab

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