Wafer-Scale Prober (IMAGE)

Optica

Wafer-Scale Prober

Caption

The researchers have developed a wafer-scale prober that is being tested at the University of Southampton (left). The prober can autonomously and accurately perform optical and electrical device testing along with laser annealing at an average speed of less than 30 seconds per device. Images on the right show a closer look at the software driven positioning stage for autonomous measurements (top-right) and the input/output fibers positioned on top of the 8-inch wafer (bottom-right).

Credit

Xia Chen, University of Southampton

Usage Restrictions

None

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.