Strengthening Thin-Film Bonds with Ultrafast Data Collection (IMAGE)

National Institute of Standards and Technology (NIST)

Strengthening Thin-Film Bonds with Ultrafast Data Collection

Caption

Temperature and structure: Graph shows heat absorbed by a thin film of aluminum as its temperature increased. Inset boxes show electron diffraction patterns captured by DTEM as temperature changes. The patterns reveal the crystal structure and orientation of the aluminum. At low temperatures, pattern is characteristic of a face-centered-cubic crystal structure. When the sample is heated past the large melting peak, the spots disappear indicating that the aluminum has lost its crystal structure due to melting.

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NIST

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