Scanning Electron Microscope Image (IMAGE)

Proceedings of the National Academy of Sciences

Scanning Electron Microscope Image

Caption

Scanning electron microscope image of a diamond nanoneedle subject to reversible elastic bending deformation.

Credit

Image credit: Amit Banerjee (Kyoto University, Kyoto, Japan), Yang Lu (City University of Hong Kong, Kowloon, Hong Kong), Ming Dao (Massachusetts Institute of Technology, Cambridge, MA), and Subra Suresh (Nanyang Technological University, Singapore, Republic of Singapore)

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