Device Schematics (IMAGE)
Caption
Device schematics. a - Schematic cross section of the device. b - Hot-electron transistor operation. Electrons are injected by applying a negative emitter-base bias, and detected in the molecular semiconductor. These electrons are out of equilibrium with the thermal electrons in the base which cannot be described by a larger temperature. The measurements can be performed either without or with externally applied collector-base bias.
Credit
Frank Ortmann
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