Cantilever Probe (IMAGE) DOE/Oak Ridge National Laboratory Caption A heated atomic force microscope cantilever probe touches a surface to be analyzed with vapor from surface material that is thermally desorbed. The heat is drawn into the ion source of the mass spectrometer, ionized and then detected and analyzed by a mass spectrometer. Credit ORNL Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.