High-Energy Diffraction Microscopy Experiments (IMAGE)
Caption
This setup is used for high-energy diffraction microscopy experiments -- it involves a rotational and axial motion system load frame insert in a conventional load frame along with near-field and far-field detectors. The loading axis is vertical, and the specimen and specimen grips rotate around the loading axis while the rest of the setup remains stationary.
Credit
Review of Scientific Instruments
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