A New Method to Measure Optical Absorption in Semiconductor Crystals (IMAGE)
Caption
(a) A scheme of temperature variable ODPL spectroscopy. The spectra of ODPL and SPL as well as r (ODPL intensity divided by SPL intensity) measured at (b) T =300 K and (c) T = 12 K.
Credit
Kazunobu Kojima
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Kazunobu Kojima
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