Arbitrary Alignment Pattens Generated by Spatial and Temporal Scanning of Light (IMAGE)

_Tokyo Institute of Technology

Arbitrary Alignment Pattens Generated by Spatial and Temporal Scanning of Light

Caption

A represents a schematic illustration of the desired patterns of alignment. B represents irradiated light patterns of expanding toroid shapes, periodic dots, and the words Tokyo Tech. C represents POM images under crossed polarizers.

Credit

Atsushi Shishido, Tokyo Institute of Technology

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