Figure 1. Precise measurements of atomic displacement and strain using Gaussian process regression (GPR) (IMAGE)

Japan Advanced Institute of Science and Technology

Figure 1. Precise measurements of atomic displacement and strain using Gaussian process regression (GPR)

Caption

(a) A HAADF image of a rod-shaped gold nanoparticle. The bright spots correspond to individual atoms. (b) Raw atomic displacements calculated via a conventional method. Larger displacements in either direction are shown in darker blue and lighter yellow. The noise in the measurement can be appreciated in the granularity of the image. (c) The true displacements predicted by GPR. The noise component was successfully removed. (d) Local strain map in the nanorod. Both cap ends exhibit bright yellow areas, indicating tensile strain along the long axis. (e) Comparison with the conventional method. By using GPR, the minimum detectable local strain was improved from 1.1% to 0.2%.

Credit

Kohei Aso from JAIST.

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