Fig.1 Top Panels (IMAGE)

Columbia University School of Engineering and Applied Science

Fig.1 Top Panels

Caption

Top panels: Scanning electron micrographs of sections of broadband meta-lenses. They are composed of silicon nanopillars with various cross-sectional shapes patterned on a glass substrate. Bottom panel: Photo showing two elements of a multi-element meta-lens imaging system.

Credit

Sajan Shrestha, Adam Overvig, Nanfang Yu/Columbia Engineering

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Please credit as: Sajan Shrestha, Adam Overvig, Nanfang Yu/Columbia Engineering

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