CIES and Advantest Develop STT-MRAM Switching Current Measurement for Memory Test Systems (IMAGE)

Tohoku University

CIES and Advantest Develop STT-MRAM Switching Current Measurement for Memory Test Systems

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Tohoku University's Center for Innovative Integrated Electronic Systems (CIES), led by Professor Tetsuo Endoh (Graduate School of Engineering at Tohoku University) has announced success on a collaboration between CIES and semiconductor test equipment supplier Advantest Corporation.

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Advantest Corporation

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