Integrated Intensity of YHO-7 110 Diffraction Peak as a Function of Temperature (IMAGE)

_Tokyo Institute of Technology

Integrated Intensity of YHO-7 110 Diffraction Peak as a Function of Temperature

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Scientists at Tokyo Institute of Technology have demonstrated the potential of a new, thin-film ferroelectric material that could improve the performance of next-generation sensors and semi-conductors.

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Tokyo Institute of Technology

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