Researchers Collecting Data (IMAGE)
Caption
University of Illinois graduate student Elsa de Becker (left) and postdoctoral researcher Steven Burgess (right) collect soybean leaf samples to use in a model that measures how well crops adapt to minute-by-minute changes in light intensity. They found that grappling with these fluctuations can cost 13% of the soybean crop's yield potential.
Credit
Claire Benjamin/RIPE project
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