Real-Time Microscopy at High Temperatures and Pressures (IMAGE)

North Carolina State University

Real-Time Microscopy at High Temperatures and Pressures

Caption

Afsaneh Rabiei is pictured here with the device she developed that can capture scanning electron microscopy (SEM) images in real time at temperatures up to 1,000 degrees Celsius while applying stresses as high as two gigapascal.

Credit

NC State University

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