MIM Imaging of SWNT Array (IMAGE)

Lehigh University

MIM Imaging of SWNT Array

Caption

(a, b) MIM capacitance images overlaid on top of AFM 3-D surface topography of an array of CVD grown aligned SWNTs on quartz substrates. Each sample has a 3.5 nm dielectric layer of (a) MgO and (b) SiO2. The impact of the increased ε for MgO is apparent, resulting in improved contrast and uniformity.

Credit

John A. Rogers, Eric Seabron, Scott MacLaren and Xu Xie from the University of Illinois at Urbana-Champaign; Slava V. Rotkin from Lehigh University; and, William L. Wilson from Harvard University

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