Scanning Tunneling Electron Microscope Images of Line Defects (IMAGE)

Rice University

Scanning Tunneling Electron Microscope Images of Line Defects

Caption

Scanning tunneling electron microscope images of line defects in 1-to-6 and 1-to-5 borophene, indicated by blue and red arrowheads, respectively, show how the defects align in a way that preserves the synthetic material's metallic nature. Scientists at Rice and Northwestern universities made the first detailed analysis of ordered defect structures in borophene.

Credit

Hersam Research Group/Northwestern University

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