Hard X-ray Angle Resolved Photoemission Spectroscopy (IMAGE)
Caption
The new hard X-ray angle-resolved photoemission spectroscopy technique lets UC Davis researchers look inside new materials and study their properties. In this case it is used to look at the magnetic properties of a dilute magnetic semiconductor, gallium manganese arsenide.
Credit
Lukasz Plucinski, Peter Grünberg Institute, Jülich, Germany.
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