Bimodal Atomic Force Microscopy (IMAGE) Osaka University Caption Bimodal atomic force microscopy provides three-dimensional force vector maps with subatomic resolution. The cantilever is simultaneously oscillated laterally and vertically to determine the vector mapping over the buckled dimers on the Ge(001) surface. Credit Osaka University Usage Restrictions None License Licensed content Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.