New JILA Apparatus Measures Fast Nanoscale Motions (IMAGE)

National Institute of Standards and Technology (NIST)

New JILA Apparatus Measures Fast Nanoscale Motions

Caption

This slow-motion simulation of the JILA nanoscale motion detector shows the wiggling of a floppy metal beam, just 100 nanometers thick, as it is struck by an electric current at the dot. Red indicates the greatest change in position from the rest state.

Credit

Credit: K. Lehnert/JILA

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