Point Contact Measurements between a Ptir Tip and TaAs Crystal (IMAGE)

Science China Press

Point Contact Measurements between a Ptir Tip and TaAs Crystal

Caption

(a) Temperature dependence of zero-bias PC resistance showing typical superconducting transition. Inset: Schematics of the PCS measurement configuration. (b) Normalized dI/dV spectra at 0.5 K under different out-of-plane magnetic fields. The navy blue line denotes zero field measurement. (c) Normalized dI/dV spectra at selected temperatures from 0.5 to 6.0 K. (d) Zoom in of the normalized zero bias conductance peak.

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