Schematic, Performance and Characterization of h-BN-Based RRAM Devices (IMAGE)
Caption
(a) Schematic of a Ti/thin h-BN/Cu RRAM device. (b) Typical I-V curves in a Ti/thin h-BN/Cu RRAM device showing bipolar RS. (c) Cumulative distribution of the resistance per cycle in HRS and LRS read at 0.1 V. (d) Cross-sectional TEM image showing defective paths (GBs) through the h-BN.
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Copyright Wiley-VCH 2017. Reproduced with permission from the authors.
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