X-Ray Speckle Pattern (IMAGE)

University of Vermont

X-Ray Speckle Pattern

Caption

A beam of X-rays scattering off a thin film of silicon form this speckle pattern that corresponds to the details of the surface. University of Vermont scientists used these kinds of images as part of a discovery that is providing a new view at the nanoscale.

Credit

Courtesy Randall Headrick, UVM

Usage Restrictions

with coverage of associated story

License

Licensed content

Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.