MIM Imaging of SWNT Array (image) Lehigh University Share Print E-Mail Caption (a, b) MIM capacitance images overlaid on top of AFM 3-D surface topography of an array of CVD grown aligned SWNTs on quartz substrates. Each sample has a 3.5 nm dielectric layer of (a) MgO and (b) SiO2. The impact of the increased ε for MgO is apparent, resulting in improved contrast and uniformity. Credit John A. Rogers, Eric Seabron, Scott MacLaren and Xu Xie from the University of Illinois at Urbana-Champaign; Slava V. Rotkin from Lehigh University; and, William L. Wilson from Harvard University Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.