The Structure of the New Material (image)

Moscow Institute of Physics and Technology

Caption

This image was obtained by atomic force microscopy (AFM). The principle of the method is to "probe" a sample with a thin tip at the end of a tiny cantilever that scans the profile with a resolution down to nanometers (in some cases, it distinguishes even atom-size protrusions).

Credit

The picture is courtesy of the researchers.

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