Microwaves Offer an Exceptional Nanoscale View (image) National Institute of Standards and Technology (NIST) Share Print E-Mail Caption NIST and ORNL scientists have devised a near-field microwave imaging approach to capture images of nanoscale processes under natural conditions. As the tip of an atomic force microscope scans over an ultrathin membrane it emits near-field microwaves into the sample below. Shown are images of yeast cells and silver dendrites, which formed on an electrode during electroplating. Credit Kolmakov/CNST Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.