Transmission Electron Microscopy (TEM) Image (p-ALD) (image) Naval Research Laboratory Share Print E-Mail Caption Image shows high magnification bright field transmission electron microscopy (TEM) image showing obvious delineation of alumina film and surface of particle. In this work, performed by NRL researchers, the growth per cycle (GPC) during atomic layer deposition is compared for different batches of powder with average particle sizes ranging from nanometer (nm) to micrometer (μm). Samples prepared after depositing thin alumina films (from 10 to15 nm) on tungsten powders using particle atomic layer deposition (p-ALD) were investigated with x-ray photoelectron spectroscopy (XPS), scanning and transmission electron microscopy (SEM), and TEM. Credit (US Naval Research Laboratory) Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.