Scanning Tunneling Electron Microscope Images of Line Defects (image) Rice University Share Print E-Mail Caption Scanning tunneling electron microscope images of line defects in 1-to-6 and 1-to-5 borophene, indicated by blue and red arrowheads, respectively, show how the defects align in a way that preserves the synthetic material's metallic nature. Scientists at Rice and Northwestern universities made the first detailed analysis of ordered defect structures in borophene. Credit Hersam Research Group/Northwestern University Usage Restrictions For news reporting purposes only. Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.