Saving Energy by Taking a Close Look Inside Transistors (image) University of Erlangen-Nuremberg Share Print E-Mail Caption Physicist Martin Hauck fits a silicon carbide transistor into the measuring apparatus: researchers at FAU have discovered a method for finding defects at the interfaces of switches. Credit FAU/Michael Krieger, Martin Hauck Usage Restrictions The image may only be used with appropriate caption or credit. Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.