Convergent-beam Microscopy (image) California Institute of Technology Share Print E-Mail Caption This is the diffraction obtained for silicon with 4D electron microscopy. The nanoscale can be determined from the patterns the structure. Credit Zewail/Science/AAAS Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.