Development of Durable MTJ Under Harsh Environment for STT-MRAM at 1Xnm Technology Node (image) Tohoku University Share Print E-Mail Caption Figure 2: (a) Thermal stability factor of MTJs with the new structure compared with those with the conventional structure. (b) Writing current of MTJs with the new structure compared with those with the conventional structure. Credit Credit: IEEE & Tohoku University Usage Restrictions Credit: IEEE & Tohoku University Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.