The image is a combination of two sets of data from X-ray scans of single crystal sapphire spheres. The reconstructed X-ray Computed Tomography (XRCT) data defines the surface of all 621 grains in the load frame. The far-field X-ray Diffraction (ff-XRD or 3DXRD) data provides a strain tensor that is mapped to each grain center. The combination and colorization of this data shows the distribution of stresses for each grain under load. This information was used as initial conditions for ultrasonic transmission measurements, where structure-property relationships were measured in-situ.