(a) The temperature coefficient of frequency (TCF) of the GaN resonator at different temperature; (b) The quality factor of the GaN resonator at different temperature.
The temporal stability of a resonator is defined by temperature coefficient of frequency (TCF). TCF indicates a change of the resonance frequency with changing temperature. For the Si MEMS resonator, its intrinsic TCF is ~ -30ppm/K. Several methods were proposed to reduce the TCF of Si resonator, but the quality factors of the system were greatly degraded. The quality factor of a resonator in the system can be used to determine the frequency resolution. A high quality factor is required for the accurate frequency reference. The developed GaN resonator in this work can simultaneously achieve a low TCF and high quality factor up to 600 K. The TCF is as low as -5 ppm/K. The quality factor is more than 105, which is the highest one ever reported in GaN system.