Ptychographic Improvement of X-Ray Microscopic Images (image) Technical University of Munich (TUM) Share Print E-Mail Caption While the test object is moved through the X-ray beam with nanometer precision, the scattered X-rays are captured by a detector. The scattering images are then reconstructed to an image of the sample. Credit Technische Universitaet Muenchen / Paul Scherrer Institute, Villigen (Switzerland) Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.