Generation of Dislocation Arrays at Grain Boundaries in Bi0.5Sb1.5Te3 (image) Institute for Basic Science Share Print E-Mail Caption This schematic illustration shows the generation of dislocation arrays during the liquid-phase compaction process. The Te liquid (red) between the Bi0.5Sb1.5Te3 grains flows out during the compacting process and facilitates the formation of dislocation arrays embedded in low-energy grain boundaries. Credit Institute for Basic Science Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.