SEM/TEM (image) Helmholtz-Zentrum Berlin für Materialien und Energie Share Print E-Mail Caption A scanning electron microscopy shows a cross section of the composite photocathode (left). By TEM analysis, nanoparticles of Pt could be identified in the TiO2 thin film (right). Credit HZB Usage Restrictions None Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.