Experiment Setup (image) University of Copenhagen - Niels Bohr Institute Share Print E-Mail Caption A series of nanowires were scanned in the nanofocused X-ray, while the reflections from the different crystal planes of the nanowires were measured. The location of the reflections provides information about tilt and deformations in the nanowires Credit Credit: Tomas Stankevic, Niels Bohr Institute, University of Copenhagen. Usage Restrictions Credit: Tomas Stankevic, Niels Bohr Institute, University of Copenhagen. Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.