Ar Plasma Treated ZnON (image) American Institute of Physics Share Print E-Mail Caption This is a cross-sectional high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) image and nanobeam diffraction pattern of Ar plasma treated ZnON. Credit E. Lee & S. Jeon/Samsung Advanced Institute of Technology & Korea University Usage Restrictions This image may be used only with appropriate caption and credit. Share Print E-Mail Disclaimer: AAAS and EurekAlert! are not responsible for the accuracy of news releases posted to EurekAlert! by contributing institutions or for the use of any information through the EurekAlert system.