Public Release: 

Dual-energy CT imaging improves pancreatic cancer assessment

American Roentgen Ray Society

TORONTO, April 20, 2015-- Dual-energy CT (DECT) has several potential applications in the detection, characterization, staging, and follow-up of pancreatic cancer patients, according to a new study conducted at Johns Hopkins University.

"DECT imaging is a promising technique, and it has the potential to improve lesion detection and characterization beyond levels available with single-energy CT imaging," said Satomi Kawamoto, MD, associate professor of radiology and radiological science at Hopkins.

Several studies have shown that DE CT can help assessment of pancreatic cancer, but its application to comprehensive analysis of pancreatic cancer has not been widely used.

Dr. Kawamoto will review and illustrate currently available DECT applications in an electronic exhibit at the ARRS 2015 Annual Meeting.

View the abstract


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