Testing of Memory's Dual-mode and Multi-Level Storage Capability. (IMAGE)

Light Publishing Center, Changchun Institute of Optics, Fine Mechanics And Physics, CAS

Testing of Memory's Dual-mode and Multi-Level Storage Capability.

Caption

Testing of Memory's Dual-mode and Multi-Level Storage Capability. (a-c) Writing using both electrical and optical signals. Then, reading using optical signals. (d-f) Writing using both electrical and optical signals. Then, reading using electrical signals.

Credit

by Gong Zhang, Yue Chen, Zijie Zheng, Rui Shao, Jiuren Zhou, Zuopu Zhou, Leming Jiao, Jishen Zhang, Haibo Wang, Qiwen Kong, Chen Sun, Kai Ni, Jixuan Wu, Jiezhi Chen & Xiao Gong

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CC BY

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